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Element-specific structural analysis of Si/B
<sub/>4</sub>
C using resonant X-ray reflectivity

Element-specific structural analysis of Si/B ₄ C using resonant X-ray reflectivity

Nayak, Maheswar; Pradhan, P. C.; Lodha, G. S.

期刊名称Journal of Applied Crystallography
作者Nayak, Maheswar; Pradhan, P. C.; Lodha, G. S.
卷第48卷
期第3期
电子ISSN1600-5767
文件大小2103.43KB
发表时间2015-06-01
DOI10.1107/S1600576715005877
页码786-796

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