Low-Frequency Noise and Random Telegraph Noise on Near-Ballistic III-V MOSFETs
Si, Mengwei; Conrad, Nathan J.; Shin, Sanghoon; Gu, Jiangjiang; Zhang, Jingyun; Alam, Muhammad Ashraful; Ye, Peide D.
- 期刊名称IEEE Transactions on Electron Devices
- 作者Si, Mengwei; Conrad, Nathan J.; Shin, Sanghoon; Gu, Jiangjiang; Zhang, Jingyun; Alam, Muhammad Ashraful; Ye, Peide D.
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小1343.48KB
- 发表时间2015
- DOI10.1109/TED.2015.2433921
- 页码1-1