Corrigendum to “On the current role of atom probe tomography in materials characterization and materials science” [Current Opinion Solid State Mater. Sci. 17/5 (2014) 217–223]

Marquis, Emmanuelle A.; Bachhav, Mukesh; Chen, Yimeng; Dong, Yan; Gordon, Lyle M.; Joester, Derk; McFarland, Adam

期刊名称Current Opinion in Solid State and Materials Science
作者Marquis, Emmanuelle A.; Bachhav, Mukesh; Chen, Yimeng; Dong, Yan; Gordon, Lyle M.; Joester, Derk; McFarland, Adam
卷第19卷
期第2期
印刷ISSN1359-0286
文件大小176.58KB
发表时间2015-04
DOI10.1016/j.cossms.2014.09.004

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