A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3D-Stacked ICs
- 期刊名称IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- 作者Agrawal, Mukesh; Chakrabarty, Krishnendu; Eklow, Bill
- 印刷ISSN0278-0070
- 电子ISSN1937-4151
- 文件大小2413.81KB
- 发表时间2015
- DOI10.1109/tcad.2015.2459044
- 页码1-1
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