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[IEEE 2015 20th International Mixed-Signal Testing Workshop (IMSTW) - Paris, France (2015.6.24-2015.6.26)] 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) - Reliability of SAR ADCs and associated embedded instrument detection

[IEEE 2015 20th International Mixed-Signal Testing Workshop (IMSTW) - Paris, France (2015.6.24-2015.6.26)] 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) - Reliability of SAR ADCs and associated embedded instrument detection

Wan, Jinbo; Kerkhoff, Hans G.

作者Wan, Jinbo; Kerkhoff, Hans G.
文件大小573.89KB
发表时间2015
DOI10.1109/IMS3TW.2015.7177870
页码1-5

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