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[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Power- and thermal-aware testing of VLSI circuits and systems

[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Power- and thermal-aware testing of VLSI circuits and systems

Chattopadhyay, Santanu

作者Chattopadhyay, Santanu
文件大小52.29KB
发表时间2015
DOI10.1109/ISVDAT.2015.7208161
页码1-1

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