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[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Effects of D<inf>it</inf>-induced degradation on InGaAs/InAlAs Nanowire Superlattice-FET using Al<inf>2</inf>O<inf>3</inf> and HfO<inf>2</inf>/La<inf>2</inf>O<inf>3</inf> as gate stacks

[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Effects of Dit-induced degradation on InGaAs/InAlAs Nanowire Superlattice-FET using Al2O3 and HfO2/La2O3 as gate stacks

Maiorano, P.; Gnani, E.; Gnudi, A.; Reggiani, S.; Baccarani, G.
  • 作者Maiorano, P.; Gnani, E.; Gnudi, A.; Reggiani, S.; Baccarani, G.
  • 文件大小226.23KB
  • 发表时间2015
  • DOI10.1109/ULIS.2015.7063772
  • 页码57-60
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