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Using active thermography and modified SVM for intelligent diagnosis of solder bumps

Using active thermography and modified SVM for intelligent diagnosis of solder bumps

Wei, Wei; Wei, Li; Nie, Lei; Su, Lei; Lu, Xiangning
  • 期刊名称Infrared Physics & Technology
  • 作者Wei, Wei; Wei, Li; Nie, Lei; Su, Lei; Lu, Xiangning
  • 卷第72卷
  • 印刷ISSN1350-4495
  • 文件大小2122.38KB
  • 发表时间2015-09
  • DOI10.1016/j.infrared.2015.08.001
  • 页码163-169
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