Nanoscale roughness micromilled silica evanescent refractometer
Carpenter, Lewis G.; Cooper, Peter A.; Holmes, Christopher; Gawith, Corin B. E.; Gates, James C.; Smith, Peter G. R.
- 期刊名称Optics Express
- 作者Carpenter, Lewis G.; Cooper, Peter A.; Holmes, Christopher; Gawith, Corin B. E.; Gates, James C.; Smith, Peter G. R.
- 卷第23卷
- 期第2期
- 电子ISSN1094-4087
- 文件大小2726.40KB
- 发表时间2015-01-26
- DOI10.1364/OE.23.001005