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Nanoscale roughness micromilled silica evanescent refractometer

Nanoscale roughness micromilled silica evanescent refractometer

Carpenter, Lewis G.; Cooper, Peter A.; Holmes, Christopher; Gawith, Corin B. E.; Gates, James C.; Smith, Peter G. R.
  • 期刊名称Optics Express
  • 作者Carpenter, Lewis G.; Cooper, Peter A.; Holmes, Christopher; Gawith, Corin B. E.; Gates, James C.; Smith, Peter G. R.
  • 卷第23卷
  • 期第2期
  • 电子ISSN1094-4087
  • 文件大小2726.40KB
  • 发表时间2015-01-26
  • DOI10.1364/OE.23.001005
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