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SPIE Proceedings [SPIE SPIE Optifab - Rochester, New York, United States (Monday 12 October 2015)] Optifab 2015 - Recent developments in IR metrology using quadri wave lateral shearing interferometry

SPIE Proceedings [SPIE SPIE Optifab - Rochester, New York, United States (Monday 12 October 2015)] Optifab 2015 - Recent developments in IR metrology using quadri wave lateral shearing interferometry

Bentley, Julie L.; Stoebenau, Sebastian; Boucher, W.; Bourgeois, G.; Deprez, M.; Homassel, E.; Wattellier, B.
  • 作者Bentley, Julie L.; Stoebenau, Sebastian; Boucher, W.; Bourgeois, G.; Deprez, M.; Homassel, E.; Wattellier, B.
  • 卷第9633卷
  • 印刷ISSN0277-786X
  • 文件大小2796.12KB
  • 发表时间2015
  • DOI10.1117/12.2195806
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