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High-Resolution Microwave Near-Field Surface Imaging Using Resonance Probes

High-Resolution Microwave Near-Field Surface Imaging Using Resonance Probes

Malyuskin, Oleksandr; Fusco, Vincent F.
  • 期刊名称IEEE Transactions on Instrumentation and Measurement
  • 作者Malyuskin, Oleksandr; Fusco, Vincent F.
  • 印刷ISSN0018-9456
  • 电子ISSN1557-9662
  • 文件大小2318.95KB
  • 发表时间2015
  • DOI10.1109/TIM.2015.2476277
  • 页码1-1
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