Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier
- 期刊名称IEEE Transactions on Microwave Theory and Techniques
- 作者Kim, Jooseung; Kim, Dongsu; Cho, Yunsung; Kang, Daehyun; Park, Byungjoon; Moon, Kyunghoon; Kim, Bumman
- 卷第63卷
- 期第12期
- 印刷ISSN0018-9480
- 电子ISSN1557-9670
- 文件大小3289.50KB
- 发表时间2015-12
- DOI10.1109/TMTT.2015.2495178
- 页码4072-4082
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