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Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging

Yazdanbakhsh, Amir; Balasubramanian, Raghuraman; Nowatzki, Tony; Sankaralingam, Karthikeyan

期刊名称IEEE Micro
作者Yazdanbakhsh, Amir; Balasubramanian, Raghuraman; Nowatzki, Tony; Sankaralingam, Karthikeyan
卷第35卷
期第6期
印刷ISSN0272-1732
文件大小2282.11KB
发表时间2015-11
DOI10.1109/MM.2015.136
页码24-36