SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Ultra-precision optical metrology using highly controlled fiber-based frequency combs
- 作者Lehmann, Peter; Osten, Wolfgang; Albertazzi Gonçalves, Armando; Minoshima, Kaoru; Nakajima, Yoshiaki; Wu, Guanhao
- 卷第9525卷
- 印刷ISSN0277-786X
- 文件大小457.65KB
- 发表时间2015
- DOI10.1117/12.2191131
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