SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] X-Ray Nanoimaging: Instruments and Methods II - Stacking multiple zone plates for efficient hard x-ray focusing at the Advanced Photon Source

• 作者Lai, Barry; Wojcik, Michael J.; Gleber, Sophie-Charlotte; Shu, Deming; Roehrig, Christian; Lai, Barry; Vine, David; Vogt, Stefan
• 卷第9592卷
• 印刷ISSN0277-786X
• 文件大小782.52KB
• 发表时间2015
• DOI10.1117/12.2187684