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SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, United States (Sunday 8 March 2015)] Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2015 - Thermal effect on E/M impedance spectroscopy of piezoelectric wafer active sensors

SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, United States (Sunday 8 March 2015)] Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2015 - Thermal effect on E/M impedance spectroscopy of piezoelectric wafer active sensors

Lynch, Jerome P.; Kamas, Tuncay; Frankforter, Erik; Yu, Lingyu Lucy; Lin, Bin; Giurgiutiu, Victor
  • 作者Lynch, Jerome P.; Kamas, Tuncay; Frankforter, Erik; Yu, Lingyu Lucy; Lin, Bin; Giurgiutiu, Victor
  • 卷第9435卷
  • 印刷ISSN0277-786X
  • 文件大小493.32KB
  • 发表时间2015
  • DOI10.1117/12.2083958
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