SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Edge detection based on adaptive threshold b-spline wavelet for optical sub-aperture measuring

• 作者Zhu, Jigui; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Han, Sen; Zhang, Shiqi; Hui, Mei; Liu, Ming; Zhao, Zhu; Dong, Liquan; Liu, Xiaohua; Zhao, Yuejin
• 卷第9623卷
• 印刷ISSN0277-786X
• 文件大小2089.31KB
• 发表时间2015
• DOI10.1117/12.2197122