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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Image Processing: Machine Vision Applications VIII - Multispectral imaging: an application to density measurement of photographic paper in the manufacturing process control

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Image Processing: Machine Vision Applications VIII - Multispectral imaging: an application to density measurement of photographic paper in the manufacturing process control

Lam, Edmund Y.; Niel, Kurt S.; Shrestha, Raju; Hardeberg, Jon Yngve

作者Lam, Edmund Y.; Niel, Kurt S.; Shrestha, Raju; Hardeberg, Jon Yngve
卷第9405卷
印刷ISSN0277-786X
文件大小795.76KB
发表时间2015
DOI10.1117/12.2083280

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