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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - An improved full automated endmember extraction algorithm based on endmember independence

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - An improved full automated endmember extraction algorithm based on endmember independence

Pagano, Thomas S.; Silny, John F.; Wang, Yiran; Zhong, Shengwei; Zhang, Ye

作者Pagano, Thomas S.; Silny, John F.; Wang, Yiran; Zhong, Shengwei; Zhang, Ye
卷第9611卷
印刷ISSN0277-786X
文件大小656.19KB
发表时间2015
DOI10.1117/12.2187865

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