[IEEE 2015 International EURASIP Workshop on RFID Technology (EURFID) - Rosenheim, Germany (2015.10.22-2015.10.23)] 2015 International EURASIP Workshop on RFID Technology (EURFID) - A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect

• 作者Vales-Alonso, Javier; Munoz-Gea, Juan Pedro; Alcaraz, Juan J.
• 文件大小120.52KB
• 发表时间2015
• DOI10.1109/eurfid.2015.7332384
• 页码48-52