[IEEE 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Blacksburg, VA, USA (2015.11.2-2015.11.4)] 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - HV GaN reliability and status

• 作者Khalil, Sameh G.; Hardikar, Shyam; Sack, Steffen; Persson, Eric; Imam, Mohamed; McDonald, Tim
• 文件大小450.42KB
• 发表时间2015
• DOI10.1109/wipda.2015.7369307
• 页码21-23