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New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron MicroscopyNiculae, A.; Bechteler, A.; Eckhardt, R.; Hermenau, K.; Liebel, A.; Lutz, G.; Schöning, A.; Soltau, H.; Strüder, L. · Microscopy and Microanalysis · 2016