Mastering the Multi-scale Challenge: A Modern Correlation Environment
- 期刊名称Microscopy and Microanalysis
- 作者Merkle, Arno P.; Lechner, Lorenz; Steinbach, Andy; Gelb, Jeff; Perez-Willard, Fabian; Phaneuf, Michael W.; Unrau, David
- 卷第21卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小347.84KB
- 发表时间2015-08
- DOI10.1017/s1431927615000872
- 页码15-16
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