Highlighting trapping phenomena in microwave GaN HEMTs by low-frequency S-parameters
- 期刊名称International Journal of Microwave and Wireless Technologies
- 作者Potier, Clément; Jacquet, Jean-Claude; Dua, Christian; Martin, Audrey; Campovecchio, Michel; Oualli, Mourad; Jardel, Olivier; Piotrowicz, Stéphane; Laurent, Sylvain; Aubry, Raphaël; Patard, Olivier; Gamarra, Piero; di Forte-Poisson, Marie-Antoinette; Delage, Sylvain L.; Quéré, Raymond
- 卷第7卷
- 印刷ISSN1759-0787
- 电子ISSN1759-0795
- 文件大小653.42KB
- 发表时间2015-06
- DOI10.1017/s1759078715000094
- 页码287-296
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