Characterization of Electron-Induced Defects in Cu (In, Ga) Se2 Thin Films by Photoluminescence
Kawakita, Shirou; Imaizumi, Mitsuru; Ishizuka, Shogo; Shibata, Hajime; Niki, Shigeru; Okuda, Shuichi; Kusawake, Hiroaki
- 期刊名称MRS Proceedings
- 作者Kawakita, Shirou; Imaizumi, Mitsuru; Ishizuka, Shogo; Shibata, Hajime; Niki, Shigeru; Okuda, Shuichi; Kusawake, Hiroaki
- 卷第1771卷
- 电子ISSN1946-4274
- 文件大小202.23KB
- 发表时间2015
- DOI10.1557/opl.2015.405
- 页码157-161