Ultra sensitive measurement of dielectric current under pulsed stress conditions
- 期刊名称Microelectronics Reliability
- 作者Helfmeier, Clemens; Beyreuther, Anne; Fox, Alexander; Boit, Christian
- 卷第55卷
- 期第11期
- 印刷ISSN0026-2714
- 文件大小645.36KB
- 发表时间2015-11
- DOI10.1016/j.microrel.2015.06.119
- 页码2254-2257
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