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Binary logic state transition oriented formal general reliability model

Binary logic state transition oriented formal general reliability model

Zhou, Yi-zhou; Ren, Yi; Liu, Lin-lin; Ma, Zheng; Wang, Zi-li

期刊名称Journal of Shanghai Jiaotong University (Science)
作者Zhou, Yi-zhou; Ren, Yi; Liu, Lin-lin; Ma, Zheng; Wang, Zi-li
卷第20卷
期第4期
印刷ISSN1007-1172
电子ISSN1995-8188
文件大小503.56KB
发表时间2015-8
DOI10.1007/s12204-015-1654-3
页码482-488

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