On the theoretical basis of metric analysis of poorly formalized problems of recognition and classification

• 期刊名称Pattern Recognition and Image Analysis
• 作者Torshin, I. Yu.; Rudakov, K. V.
• 卷第25卷
• 期第4期
• 印刷ISSN1054-6618
• 电子ISSN1555-6212
• 文件大小734.14KB
• 发表时间2015-10
• DOI10.1134/S1054661815040252
• 页码577-587