Electronic structure and insulating gap in epitaxial VO
2
polymorphs
Lee, Shinbuhm; Meyer, Tricia L.; Sohn, Changhee; Lee, Donghwa; Nichols, John; Lee, Dongkyu; Seo, Sung S. Ambrose; Freeland, John W.; Noh, Tae Won; Lee, Ho Nyung
- 期刊名称APL Materials
- 作者Lee, Shinbuhm; Meyer, Tricia L.; Sohn, Changhee; Lee, Donghwa; Nichols, John; Lee, Dongkyu; Seo, Sung S. Ambrose; Freeland, John W.; Noh, Tae Won; Lee, Ho Nyung
- 卷第3卷
- 期第12期
- 电子ISSN2166-532X
- 文件大小1191.53KB
- 发表时间2015-12
- DOI10.1063/1.4939004