XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature

Prestat, Eric; Smith, Matthew; Janssen, Arne; Slater, Thomas J. A.; Camargo, Pedro H. C.; Kulzick, Matthew A.; Grace Burke, M.; Haigh, Sarah J.; Zaluzec, Nestor J.

期刊名称Microscopy and Microanalysis
作者Prestat, Eric; Smith, Matthew; Janssen, Arne; Slater, Thomas J. A.; Camargo, Pedro H. C.; Kulzick, Matthew A.; Grace Burke, M.; Haigh, Sarah J.; Zaluzec, Nestor J.
卷第21卷
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小419.63KB
发表时间2015-08
DOI10.1017/s1431927615002032
页码247-248

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XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature