Effect of defect dipole-induced aging on the dielectric property of Fe3+-doped Na0.5Bi0.5TiO3 thin film
Lv, P.P.; Yang, C.H.; Geng, F.J.; Feng, C.; Jiang, X.M.; Hu, G.D.
- 期刊名称Ceramics International
- 作者Lv, P.P.; Yang, C.H.; Geng, F.J.; Feng, C.; Jiang, X.M.; Hu, G.D.
- 卷第42卷
- 期第2期
- 印刷ISSN0272-8842
- 文件大小1179.34KB
- 发表时间2016-02
- DOI10.1016/j.ceramint.2015.10.025
- 页码2876-2881