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Quantitative detection of thermal barrier coating thickness based on simulated annealing algorithm using pulsed infrared thermography technology

Quantitative detection of thermal barrier coating thickness based on simulated annealing algorithm using pulsed infrared thermography technology

Bu, Chiwu; Tang, Qingju; Liu, Yuanlin; Yu, Fengyun; Mei, Chen; Zhao, Yawei

期刊名称Applied Thermal Engineering
作者Bu, Chiwu; Tang, Qingju; Liu, Yuanlin; Yu, Fengyun; Mei, Chen; Zhao, Yawei
印刷ISSN1359-4311
文件大小903.62KB
发表时间2016-2
DOI10.1016/j.applthermaleng.2016.01.143

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