Investigations on high-κ dielectrics for low threshold voltage and low leakage zinc oxide thin-film transistor, using material selection methodologies
- 期刊名称Journal of Materials Science: Materials in Electronics
- 作者Kandpal, Kavindra; Gupta, Navneet
- 印刷ISSN0957-4522
- 电子ISSN1573-482X
- 文件大小856.70KB
- 发表时间2016-2-18
- DOI10.1007/s10854-016-4519-0
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