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[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Efficient Error-Detection and Recovery Mechanisms for Reliability and Resiliency of Multicores

[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Efficient Error-Detection and Recovery Mechanisms for Reliability and Resiliency of Multicores

Kundu, Sandip; Khan, Omer
  • 作者Kundu, Sandip; Khan, Omer
  • 文件大小167.94KB
  • 发表时间2016
  • DOI10.1109/VLSID.2016.133
  • 页码12-13
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