Damage and strain identification in multifunctional materials via electrical impedance tomography with constrained sine wave solutions
Tallman, T. N.; Wang, K. W.
- 期刊名称Structural Health Monitoring
- 作者Tallman, T. N.; Wang, K. W.
- 卷第15卷
- 期第2期
- 印刷ISSN1475-9217
- 电子ISSN1741-3168
- 文件大小3511.95KB
- 发表时间2016-03-01
- DOI10.1177/1475921716635574
- 页码235-244