Adhesion Limits and Design Criteria for Nanorelays

Lin, Kevin L.; Cross, Graham L. W.; Gleeson, Peter; de Silva, Johann P.; Levander, Alejandro; Munoz, Jorge A.; Pawashe, Chytra; Potie, Alexis; Theofanis, Patrick; Boland, John J.; Kuhn, Kelin J.

期刊名称IEEE Transactions on Electron Devices
作者Lin, Kevin L.; Cross, Graham L. W.; Gleeson, Peter; de Silva, Johann P.; Levander, Alejandro; Munoz, Jorge A.; Pawashe, Chytra; Potie, Alexis; Theofanis, Patrick; Boland, John J.; Kuhn, Kelin J.
卷第63卷
期第1期
印刷ISSN0018-9383
电子ISSN1557-9646
文件大小1214.53KB
发表时间2016-1
DOI10.1109/ted.2015.2496155
页码465-470

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Adhesion Limits and Design Criteria for Nanorelays