Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"

• 期刊名称IEEE Transactions on Software Engineering
• 作者Tantithamthavorn, Chakkrit; McIntosh, Shane; Hassan, Ahmed E.; Matsumoto, Kenichi
• 印刷ISSN0098-5589
• 电子ISSN1939-3520
• 文件大小383.25KB
• 发表时间2016
• DOI10.1109/TSE.2016.2553030
• 页码1-1