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$Multifractal analysis and optical properties of nanostructured silicon layers$

Multifractal analysis and optical properties of nanostructured silicon layers

Jurečka, Stanislav; Matsumoto, Taketoshi; Imamura, Kentaro; Kobayashi, Hikaru

期刊名称Applied Surface Science
作者Jurečka, Stanislav; Matsumoto, Taketoshi; Imamura, Kentaro; Kobayashi, Hikaru
印刷ISSN0169-4332
文件大小2716.64KB
发表时间2016-4
DOI10.1016/j.apsusc.2016.04.059

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