Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Clemente, Juan Antonio; Franco, Francisco J.; Villa, Francesca; Baylac, Maud; Rey, Solenne; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小1167.46KB
- 发表时间2016
- DOI10.1109/TNS.2016.2551263
- 页码1-8
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