Measurement uncertainty limit analysis of biased estimators in RFID multiple tags system
- 期刊名称IET Science, Measurement & Technology
- 作者Yu, Xiaolei; Yu, Yinshan; Wang, Donghua; Zhao, Zhimin; Liu, Jialing
- 卷第10卷
- 期第5期
- 印刷ISSN1751-8822
- 电子ISSN1751-8830
- 文件大小572.28KB
- 发表时间2016-08-01
- DOI10.1049/iet-smt.2015.0202
- 页码449-455
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