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[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - IoT: Source of test challenges

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - IoT: Source of test challenges

Marinissen, Erik Jan; Zorian, Yervant; Konijnenburg, Mario; Chih-Tsun Huang, ; Ping-Hsuan Hsieh, ; Cockburn, Peter; Delvaux, Jeroen; Rozic, Vladimir; Bohan Yang, ; Singelee, Dave; Verbauwhede, Ingrid; Mayor, Cedric; van Rijsinge, Robert; Reyes, Cocoy
  • 作者Marinissen, Erik Jan; Zorian, Yervant; Konijnenburg, Mario; Chih-Tsun Huang, ; Ping-Hsuan Hsieh, ; Cockburn, Peter; Delvaux, Jeroen; Rozic, Vladimir; Bohan Yang, ; Singelee, Dave; Verbauwhede, Ingrid; Mayor, Cedric; van Rijsinge, Robert; Reyes, Cocoy
  • 文件大小575.42KB
  • 发表时间2016
  • DOI10.1109/ETS.2016.7519331
  • 页码1-10
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