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[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional Materials

[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional Materials

Hlawacek, Gregor; Gölzhäuser, Armin

作者Hlawacek, Gregor; Gölzhäuser, Armin
文件大小1113.24KB
发表时间2016
DOI10.1007/978-3-319-41990-9_11
页码245-262

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