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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - On-axis Reverse Hartmann test in aspheric optical surface test with the optical flat calibration

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - On-axis Reverse Hartmann test in aspheric optical surface test with the optical flat calibration

Hanssen, Leonard M.; Xia, Zhengzheng; Hui, Mei; Zhao, Zhu; Liu, Ming; Dong, Liquan; Liu, Xiaohua; Kong, Lingqin; Zhao, Yuejin
  • 作者Hanssen, Leonard M.; Xia, Zhengzheng; Hui, Mei; Zhao, Zhu; Liu, Ming; Dong, Liquan; Liu, Xiaohua; Kong, Lingqin; Zhao, Yuejin
  • 卷第9961卷
  • 印刷ISSN0277-786X
  • 文件大小379.04KB
  • 发表时间2016
  • DOI10.1117/12.2236120
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