SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - On-axis Reverse Hartmann test in aspheric optical surface test with the optical flat calibration
Hanssen, Leonard M.; Xia, Zhengzheng; Hui, Mei; Zhao, Zhu; Liu, Ming; Dong, Liquan; Liu, Xiaohua; Kong, Lingqin; Zhao, Yuejin
- 作者Hanssen, Leonard M.; Xia, Zhengzheng; Hui, Mei; Zhao, Zhu; Liu, Ming; Dong, Liquan; Liu, Xiaohua; Kong, Lingqin; Zhao, Yuejin
- 卷第9961卷
- 印刷ISSN0277-786X
- 文件大小379.04KB
- 发表时间2016
- DOI10.1117/12.2236120