[IEEE 2016 Progress in Electromagnetic Research Symposium (PIERS) - Shanghai, China (2016.8.8-2016.8.11)] 2016 Progress in Electromagnetic Research Symposium (PIERS) - Effect of electromagnetic interference (EMI) on the performance of class-AB CMOS transconductance stage
- 作者Abuelma'atti, Muhammad Taher; Abuelmaatti, Ali M. T.
- 文件大小194.47KB
- 发表时间2016
- DOI10.1109/PIERS.2016.7734408
- 页码635-639
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