CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization
- 期刊名称IEEE Transactions on Circuits and Systems I: Regular Papers
- 作者Sheikh, Kaship; Han, Shu-Jen; Wei, Lan
- 卷第63卷
- 期第12期
- 印刷ISSN1549-8328
- 电子ISSN1558-0806
- 文件大小2544.15KB
- 发表时间2016-12
- DOI10.1109/tcsi.2016.2617828
- 页码2209-2221
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