[IEEE 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Sendai, Japan (2016.4.17-2016.4.20)] 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - CNT handling with van der Waals force inside a SEM for FET application
Wang, Yaqiong; Yang, Zhan; Chen, Tao; Yang, Lijun; Sun, Lining; Fukuda, Toshio
- 作者Wang, Yaqiong; Yang, Zhan; Chen, Tao; Yang, Lijun; Sun, Lining; Fukuda, Toshio
- 文件大小1142.18KB
- 发表时间2016
- DOI10.1109/nems.2016.7758211
- 页码111-116