On some problems of modeling the distributions of minority charge carriers generated by an electron beam in a semiconductor material

• 期刊名称Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
• 作者Seregina, E. V.; Stepovich, M. A.; Makarenkov, A. M.; Filippov, M. N.
• 卷第10卷
• 期第2期
• 印刷ISSN1027-4510
• 电子ISSN1819-7094
• 文件大小334.02KB
• 发表时间2016-3
• DOI10.1134/S1027451016020348
• 页码445-449