Threshold for permanent refractive index change in crystalline silicon by femtosecond laser irradiation
Bachman, D.; Chen, Z.; Fedosejevs, R.; Tsui, Y. Y.; Van, V.
- 期刊名称Applied Physics Letters
- 作者Bachman, D.; Chen, Z.; Fedosejevs, R.; Tsui, Y. Y.; Van, V.
- 卷第109卷
- 期第9期
- 印刷ISSN0003-6951
- 电子ISSN1077-3118
- 文件大小475.07KB
- 发表时间2016-08-29
- DOI10.1063/1.4961568