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[IEEE 2016 15th Biennial Baltic Electronics Conference (BEC) - Tallinn, Estonia (2016.10.3-2016.10.5)] 2016 15th Biennial Baltic Electronics Conference (BEC) - A tool for random test generation targeting high diagnostic resolution

[IEEE 2016 15th Biennial Baltic Electronics Conference (BEC) - Tallinn, Estonia (2016.10.3-2016.10.5)] 2016 15th Biennial Baltic Electronics Conference (BEC) - A tool for random test generation targeting high diagnostic resolution

Osimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund

作者Osimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund
文件大小309.39KB
发表时间2016
DOI10.1109/bec.2016.7743733
页码79-82

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