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[IEEE 2016 International Symposium on Integrated Circuits (ISIC) - Singapore (2016.12.12-2016.12.14)] 2016 International Symposium on Integrated Circuits (ISIC) - A dual redundancy radiation-hardened Flip-Flop based on C-element in 65nm process

[IEEE 2016 International Symposium on Integrated Circuits (ISIC) - Singapore (2016.12.12-2016.12.14)] 2016 International Symposium on Integrated Circuits (ISIC) - A dual redundancy radiation-hardened Flip-Flop based on C-element in 65nm process

Jaya, Gibran Limi; Shoushun Chen, ; Liter, Siek

作者Jaya, Gibran Limi; Shoushun Chen, ; Liter, Siek
文件大小615.51KB
发表时间2016
DOI10.1109/ISICIR.2016.7829721
页码1-4

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